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No Test Access around DDR2 Devices!!

Question asked by sunuplin

on Jul 14, 2008
Latest reply on Jul 22, 2008 by Dennis_Dyer

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Heard this is a rule that we can not put test points on high speed signal bus. It's hurting me when I have to manually generate the tests for DDR2 devices.

Can Agilent ICT solve my problems? Heard about DriveThru.. What's Drive Thru?

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Dennis_Dyer Jul 22, 2008 1:40 PM
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Placing test pads on high speed signal busses to gain access can be very tricky. The test pads and the subsequent layout changes involved affect the capacitance and impedance of the trace. We have done studies on this problem and introduced 'bead probe' technology to help with this problem. Using 'bead probe' technology to gain access on these high speed traces does not affect the trace out to 10Ghz that we have tested.

If you haven't heard of Agilent Bead Probe technology, contact your Agilent Salesman or visit the Agilent Website to learn more.

www.agilent.com/see/beadprobe
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