Is there a way where 3070 system can track this testjet situation automatically?
Situation:
you have net connections as follows:
NODE1
IC1.1
R2.2;
NODE2
IC1.5
R2.1;
where, IC1 --> has testjet test
R2 -- value set to 100 ohm
During debug, wrong R2 value was given by customer, instead, R2 true value is 0 ohm resistor.
Wrong value of R2 will generate wrong testjet file on IC1:
100 ohm will generate:
device "ic1"
test pins 1
test pins 5
end device
True value of R2, 0 ohm will give a different testjet file on IC1:
device "ic1"
test pins 1,5
end device
R2 and shorts tests will surely be noticed but not testjet.
Without changing the 100-ohm generated testjet, IC1 will pass on testjet even if one of the pin 1 or pin 5 is not soldered.
I wish there are some extra applications under debug that would track the open-to-shorted conditions on testjeted devices so that correct testjet file be re-generated automatically.
Situation:
you have net connections as follows:
NODE1
IC1.1
R2.2;
NODE2
IC1.5
R2.1;
where, IC1 --> has testjet test
R2 -- value set to 100 ohm
During debug, wrong R2 value was given by customer, instead, R2 true value is 0 ohm resistor.
Wrong value of R2 will generate wrong testjet file on IC1:
100 ohm will generate:
device "ic1"
test pins 1
test pins 5
end device
True value of R2, 0 ohm will give a different testjet file on IC1:
device "ic1"
test pins 1,5
end device
R2 and shorts tests will surely be noticed but not testjet.
Without changing the 100-ohm generated testjet, IC1 will pass on testjet even if one of the pin 1 or pin 5 is not soldered.
I wish there are some extra applications under debug that would track the open-to-shorted conditions on testjeted devices so that correct testjet file be re-generated automatically.