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SHORTED pins under TESTJET

Question asked by edoga on Nov 7, 2008
Is there a way where 3070 system can track this testjet situation automatically?

Situation: 
you have net connections as follows:
    NODE1
        IC1.1
        R2.2;
    NODE2
        IC1.5
        R2.1;

where, IC1  --> has testjet test
           R2   --  value set to 100 ohm

During debug, wrong R2 value was given by customer, instead, R2 true value is 0 ohm resistor.

Wrong value of R2 will generate wrong testjet file on IC1:
100 ohm will generate:
device "ic1"
   test pins 1
   test pins 5
end device

True value  of R2, 0 ohm will give a different testjet file on IC1:
device "ic1"
    test pins 1,5
end device

R2 and shorts tests will surely be noticed but not testjet.
Without changing the 100-ohm generated testjet, IC1 will pass on testjet even if one of the pin 1 or pin 5 is not soldered.

I wish there are some extra applications under debug that would track the open-to-shorted conditions on testjeted devices so that correct testjet file be re-generated automatically.  

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