I am looking for a solution to characterize a discrete bipolar RF power transistor.
In other words, take measurements and extract a model to use in Spice (e.g. Gummel-Poon, VBIC, Mextram, etc.).
Does Keysight have a solution in terms of both measuring equipment and software?
At the time I used IC-CAP for extracting BSIM and EKV parameters for MOS, but I don't remember if IC_CAP supports bipolar.
Thanks in advance.