I'd trying to write an automated test routine to characterise an RF device that has an SPI interface (ADAR1000). I would like to program the registers of this device, then measure its RF performance using automated test equipment. The test equipment control side I understand but I do not know if this is something VEE is capable of?
I have access to the SPI signals of the device under test (DUT) but I have no idea what is the best way to interface VEE with the SPI. Should I use an FTDI interface (such as an USB-MPSSE cable)?