Hi Keysight community,
May I ask if it is possible to perform PLTS gating on a measured TDR plot TDD11 at the SMA launch region and observe SDD21 for the rest of the interconnect along the thru path? I read up some application material but many only describe using gating approach to observe just the reflections. Any insight will be much appreciated.
Many thanks.
The short answer is no, it is not simply possible. The long answer is it is possible to gate around just the SMA connector, and get the reflection from it, then create a model that matches that reflection, then de-embed that model from S21 measurement. But this will only account for reflections and not loss through the SMA.
Thank you Dr. Joel for the explanation.
The short answer is no, it is not simply possible. The long answer is it is possible to gate around just the SMA connector, and get the reflection from it, then create a model that matches that reflection, then de-embed that model from S21 measurement. But this will only account for reflections and not loss through the SMA.