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Non-linear differential device measurement

Question asked by kozy on Jun 19, 2007
Latest reply on Jun 26, 2007 by kozy
I would like to measure a power-dependent input impedance of an on-wafer non-linear differential 1-port device.  I guess I cannot use a conventional method in which mixed-mode S-parameters are calculated from multiple single-ended S-parameter measurements since the DUT is non-linear.  How can I measure such devices? 
I think I can convert unbalanced signal to balanced by using a physical balun and it can be supplied with a differential probe, but I don't know how to perform a calibration and calculate power levels at the probe tip.
Can I consider a balun with a differential probe to be reciprocal (symmetric)?  If so, I guess I can determine S-parameters of them and de-embed them.