Is there a way to measure the noise by using a PNA-X for a fully differential amplifier IC?
Thanks in advance
The only straight forward way is to add baluns to the differential ports and then de-embed the baluns from the standard noise figure measurement. But on-wafer this is more complicated because you have to de-embed the combination of the balun and the differential probe from each differential port.
My colleague, Dr_Joel, wrote a paper on differential noise figure measurements that you can reference here:
You are able to make Noise Figure measurements for differential amplifiers using the PNA-X. This application note explains Noise Figure measurements using the PNA-X:
Page 40 goes into detail on measuring differential devices.
Thanks in deed. Is there also an application note on how to measure the compression point P1dB for a differential amp?
Here is a white paper on Advanced Measurements and Modeling of Differential Devices:
See if this is helpful.
That papers quite a bit older than the modern techniques.
For PNA-X you can use option 460 (True-mode stimulus) in a power sweep mode to get single-frequency compression curves. But note that the output power is not easy to obtain in this mode.
Option 089 (Differential and IQ) allows you to create a similar sweep and to get differential power (input and output) directly. It is what I would recommend.
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