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Capacitor characterization using an E5071C

Question asked by GuiXZatS on Nov 10, 2015
Latest reply on Nov 19, 2015 by G0HZU
Hi everybody,

I am trying to characterize a capacitive device using an E5071C ENA.
We perform a OSL calibration at the end of the cables and then port extension using a SHORT on the characterization board using the loss compensation. 
When I do measurements using the frequency span from 300 kHz to 3 GHz, the expected Q value is lower than expected, specially in the lower frequencies.
When I do measurements using narrower span, I can see that the Q value is higher.
I can see that the loss compensation is measured for only 2 frequencies (looking at the corresponding sub-menu in the CALIBRATION/PORT EXTENSION menu).

Questions:

1.- Why I have so different results between the full span measurements and the narrower span measurements?
2.- Is it any method to calibrate the loss for more points in the full span? 
3.- Could normalization help?

Please find attache a plot of the results.

Any hint will be really appreciated


Thank you in advance

GuiX  

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