I don't actually have figures on both systems measurement times. I would say the i3070 is faster since the measurement and "judging" (pass/fail) of the tests are done on the 3070 module itself, independently from the computer, also, if you are using throughput multiplier every module is doing passive analog measurements at the same time. In other words is like having 4 small ICTs working together testing one board each. Throughput multiplier is designed to test boards in an homogeneous panels with node count < 1200.
If your applications comes in a panel, take a look to the throughput multiplier optio,n also the dual well shared wiring option can save you loading/unload time (some times called ping-pong fixture). Even the dual well option can theoretically be implemented on an i1000, it will require two presses to do so, something that with a vacuum fixture can be done pretty easily.
I don't actually have figures on both systems measurement times. I would say the i3070 is faster since the measurement and "judging" (pass/fail) of the tests are done on the 3070 module itself, independently from the computer, also, if you are using throughput multiplier every module is doing passive analog measurements at the same time. In other words is like having 4 small ICTs working together testing one board each. Throughput multiplier is designed to test boards in an homogeneous panels with node count < 1200.
If your applications comes in a panel, take a look to the throughput multiplier optio,n also the dual well shared wiring option can save you loading/unload time (some times called ping-pong fixture). Even the dual well option can theoretically be implemented on an i1000, it will require two presses to do so, something that with a vacuum fixture can be done pretty easily.