Hi
I am trying to measure the resistance of thin film using four probe method. The problem is my thin film is of semiconductor so I cannot provide too much high current to the sample because of the power dissipation. So I tried to give current in nano volts and for that purpose I used current source meter U2722a and to measure the voltage across the sample I am using 3458A nanovolt meter.
The problem I am facing now is that I want to run the whole experiment using LABVIEW and for that purose I was able to interface the current source but I am having touble interface 3458A. I am not getting the desired values.
One more question is that can I use different current source and measure voltage using do different electronic devices ? Or do I have to use only Agilent 3458A for four point measurement. Expect a reply soon.
Thank You
I am trying to measure the resistance of thin film using four probe method. The problem is my thin film is of semiconductor so I cannot provide too much high current to the sample because of the power dissipation. So I tried to give current in nano volts and for that purpose I used current source meter U2722a and to measure the voltage across the sample I am using 3458A nanovolt meter.
The problem I am facing now is that I want to run the whole experiment using LABVIEW and for that purose I was able to interface the current source but I am having touble interface 3458A. I am not getting the desired values.
One more question is that can I use different current source and measure voltage using do different electronic devices ? Or do I have to use only Agilent 3458A for four point measurement. Expect a reply soon.
Thank You