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unknown thru

Question asked by nickmmw on Mar 24, 2014
Latest reply on Mar 31, 2014 by nickmmw
Hello,

I would like to determine the S-parameters of each half of an on-wafer THRU through two-tiers of calibration. More specifically:

- A first tier calibration is performed on-wafer on substrate-A using TRL (since we have TRL standards in this substrate technology)

- For substrate-B, we only have one-length of transmission-line/THRU (we do not have a complete set of calibration standards for substrate-B)

- Is it possible to determine the left and right two-port error-boxes as defined between substrate-A's/1st-tier calibration reference-plane and to the center of substrate-B's THRU ? (note: we know the length of the THRU and the substrate Er)

- if we had a full set of TRL standards on substrate-B, we could easily determine the left and right error-boxes, i.e. the left and right half-length S-Parameters of the THRU.

- can any of the PNA-X calibration-methods or Macros return the 2-port S-parameters of each half of the THRU on substrate-B for the situation described ? 

thank you.

Edited by: nickmmw on Mar 24, 2014 2:25 PM

Edited by: nickmmw on Mar 24, 2014 2:46 PM

Edited by: nickmmw on Mar 24, 2014 9:14 PM  

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