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De-embedding the probestation connectors without a wafer based standard

Question asked by vimal on Feb 26, 2014
Latest reply on Mar 11, 2014 by rfelectek
Hi,
I am trying to measure the S21 parameter for a SAW device.I am using a 2-port PNA agilent 
The trouble is I have to connect long co-axial cables and probes on Cascade microtech probestation to be able to make contact to DUT.
Hence I have to be able move the measurement plane to the tip of the probes.

I have been reading about characterizing test fixtures of a probe station on here:
http://cp.literature.agilent.com/litweb/pdf/5988-6522EN.pdf 

Pretty much everyone is saying I'll need the Wafer standard to carry out the above mentioned calibration.
I don't think I'll be able to buy the said wafer standard or the software.

My question is:
Is there a way I can measure the two-port Short, open(on both ports)  and through data and save it in .s2p files. Somehow use these .s2p files to deduct the fixture(probes and coaxial ables) characteristics from the measured data?

Any help would be appreciated  

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