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Wafer Probe De-Embedding

Question asked by j_williston on Jan 25, 2014
Latest reply on Jan 28, 2014 by j_williston
We would like to characterize our co-planar wafer probes between the SMA connector and the tips.  We were thinking of using the "Fixture Characterization Using One-Port Calibrations" in section 9.3.1 of the Handbook of Microwave Measurements.  We were going to use the ECal for the SMA side and wafer SOL terminations for the probe side.  Could you give us your opinion of the feasibility of this technique for wafer probe de-embedding?