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Model extraction and verification at 45-nm process nodes

Question asked by kaelly_farnham Employee on Jul 9, 2013
Process variation, layout-dependent effects and reliability issues all bring new challenges to advanced device modeling under 45 nm. Read about how Shanghai ICRD chose Agilent's MBP and MQA 2013 to ease their entire device modeling process. 

"As a loyal Agilent customer, we are proud to be using MBP and MQA software," said Shoumian Chen, vice president of Shanghai ICRD. "The major enhancements in MBP/MQA 2013.01 enable us to complete the tedious aspects of our modeling work much more efficiently. Model Reviewer, for example, allows us to standardize various aspects of device modeling in a team environment. Because it is based on Agilent's unified end-to-end device modeling platform, it ensures seamless data transfers during the modeling process."

Read more about Shanghai ICRDs adoption of MBP and MQA.
Explore Agilent's Model Builder Program  (MBP) and Model Quality Assurance (MQA) software.