Hi all,
I am trying to setup a test to measure crystal oscillator startup time using oscilloscope ( DSOX2000). I used single shot mode and was able to get the signal from start but the scope did not have enough memory to record the whole startup time.
So does anyone know if I can setup a gated measurement or some how reduce the resolution of the scope if possible ?
Thanks for any idea.
I am trying to setup a test to measure crystal oscillator startup time using oscilloscope ( DSOX2000). I used single shot mode and was able to get the signal from start but the scope did not have enough memory to record the whole startup time.
So does anyone know if I can setup a gated measurement or some how reduce the resolution of the scope if possible ?
Thanks for any idea.
>
> So does anyone know if I can setup a gated measurement or some how reduce the resolution of the scope if possible ?
As you change the Horizontal setting of the scope, it automatically goes to maximum depth, then slows down the sample rate. You can set the scope to capture multiple seconds, but as you do that the BW of the scope drops, as the sample rate drops. As long as your sample rate is at least 5-10 times the frequency of your crystal, you should be able to get a good picture of the waveform of the crystal. This is done with the larger knob in the 'horizontal' section of the front panel.
The smaller knob in the 'horizontal' section (near where it says 'Push to Zero'), adjusts the delay. If you turn it to the left, the the 'actual' trigger event moves off the left of the screen, and the 'displayed' trigger point stays on the screen. If you set your scope, for example, to 5 msec per division, and adjust the horizontal to 50 msec, then the 'actual' trigger is 25 msec to the left of the screen, and the time from 25msec to 75msec (after the trigger) is on the screen.
By adjusting the horizontal to various values, you should be able to get a good picture of the startup of your crystal.
> Thanks for any idea.
You're welcome.
Al