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ErinEast
Click to view contentTo measure current with an oscilloscope, you have to use a current probe. The problem is, there are so many types of current probes available now, and it’s hard to know when to use what. When you think about current probing, there are three main categories that most applications fit into: High current General purpose Low current Each of the… (Show more)
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ErinEast
Click to view contentDifferent instrument form factors are used for each of the various design and test phases in a project to increase efficiency. Many engineers believe their only choices for high performance measurements are large bench instruments, or modular choices. The USB platform is a popular option for anyone needing a small, portable device. However, most… (Show more)
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BoonCampbell
Click to view contentHave you ever been fighting noise on your measurements and can’t tell where it’s coming from? There are four possible contributors: Your device under test Your probe Your oscilloscope Or a combination of all three.   Learn about the different ways you can minimize noise impacts and improve the quality of your measurements.   System Noise… (Show more)
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AI LEE KUAN
Click to view contentGet the most benefit from your DDR4 and next generation memory designs   DDR4 DRAM technology with fast data rates of 1600 MT/s and higher forced the industry to adopt high speed serial interface testing methodologies. Traditional setup and hold time tests are now replaced with eye diagrams and mask tests to account for bit error rate. Many DDR4… (Show more)
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melissakeysight
Click to view contentPower Quality Determines the Performance of Your Device Your product’s functional reliability is directly proportional to the quality of the DC power inside your product. Intuitively this makes sense: Stable DC supplies should not cause issues. Unstable DC supplies can cause unreliable performance.   In today’s products, IC density is increasing… (Show more)
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