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Different instrument form factors are used for each of the various design and test phases in a project to increase efficiency. Many engineers believe their only choices for high performance measurements are large bench instruments, or modular choices. The USB platform is a popular option for anyone needing a small, portable device. However, most… (Show moreShow less)
Have you ever been fighting noise on your measurements and can’t tell where it’s coming from? There are four possible contributors: Your device under test Your probe Your oscilloscope Or a combination of all three. Learn about the different ways you can minimize noise impacts and improve the quality of your measurements. System Noise… (Show moreShow less)
Get the most benefit from your DDR4 and next generation memory designs DDR4 DRAM technology with fast data rates of 1600 MT/s and higher forced the industry to adopt high speed serial interface testing methodologies. Traditional setup and hold time tests are now replaced with eye diagrams and mask tests to account for bit error rate. Many DDR4… (Show moreShow less)
Power Quality Determines the Performance of Your Device Your product’s functional reliability is directly proportional to the quality of the DC power inside your product. Intuitively this makes sense: Stable DC supplies should not cause issues. Unstable DC supplies can cause unreliable performance. In today’s products, IC density is increasing… (Show moreShow less)
The diode is a crucial component to master if you want to grow your electronics prowess. So, it’s crucial to have a solid understanding of how diodes behave under varying loads. Today we’re going to look at some diode fundamentals, then take a look at a video covering 4 ½ practical uses for a diode. Download the "6 Essentials for Getting the… (Show moreShow less)
Did you know that when you probe your DUT, the probe becomes part of the circuit? All probes have a loading effect on your circuit to some extent. These effects can manifest into overshoot, ringing, slow rise/fall times, propagation delays and DC offset problems. In addition, the loading impacts vary as you probe from DC voltages through high… (Show moreShow less)
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