KeysightEEsofEDA

Keysight Technologies Seamlessly Integrates Low-Frequency Noise Measurements in Wafer Level Solution Platform

Blog Post created by KeysightEEsofEDA Employee on Jul 27, 2016

Keysight Technologies, Inc. (NYSE: KEYS) today announced the newest release of its high-performance, Advanced Low-Frequency Noise Analyzer (A-LFNA), which is designed to make fast, accurate and repeatable low-frequency noise measurements. The release features a new user interface and tight integration with Keysight's WaferPro Express software — a platform that performs automated wafer-level measurements of semiconductor devices.
http://about.keysight.com/en/newsroom/pr/2016/19jul-nr16089.shtml

More information about the A-LFNA is available at www.keysight.com/find/eesof-a-lfna. Images of the analyzer are available at www.keysight.com/find/A-LFNA_images. A video on A-LFNA is available on YouTube at https://youtu.be/dE__pYPFX2U.

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